Computer-controlled scanning electron microscopy: A fast and reliable tool for diamond prospecting Journal Article uri icon

DCO ID 11121/3663-8117-1516-6590-CC

in language

  • eng

year of publication

  • 2009

abstract

  • Computer-controlled scanning electron microscopy is introduced as a faster, reliably and cost-reducing alternative to conventional electron microprobe analyses on kimberlite indicator minerals. The method is based on conventional scanning electron microscopy and energy dispersive X-ray spectrometry, but due to extended counting times, optimised settings and computer-controlled particle recognition valid data can be obtained on a low amount of operator and machine time. A comparison of the results between both methods yields that computer-controlled scanning electron microscopy is able to investigate major and minor element concentrations in indicator minerals with almost the same precision as the electron microprobe. (C) 2009 Elsevier B.V. All rights reserved.

volume

  • 103

issue

  • 1